Description
Silicon can transmission infrared lights, making it widely used in thermal imaging systems in the infrared optical components.
All optical components are fully inspected and controlled. Whether it’s a spherical lens, a sphere, window, mirror, prism or wedge, sliced or beveled to your specifications, our manufacturing capability and expertise to meet your needs.
Infrared window
Spherical lens
Prism
Material: czochralski silicon (CZ) or (FZ) FZ-Si
Type | Por N |
Orientation | <100>or<111> |
Purity | 6N–9N |
Tolerance | ±0.01-±0.1 |
Chamfering | C0.3-0.5×45° |
Depth of parallelism | 0.02mm |
1 | Parallelism | <3 arc minutes |
2 | Flatness | 1/4λ-10λper inch @633nm |
3 | Surface quality | 5-10/60-40 |
4 | Tolerance | ±0.02-±0.1 |
5 | Chamfer | 0.1-0.5*45°C |
Parameters of optical grade silicon
Materials | Optical Grade Silicon |
Purity | >99.9999% |
Growth method | FZ |
Type | N or P |
Orientation | <100> or <111> |
Resistivity | >100 ohm.cm |
Transmittance | >52.5% |
Oxygen Concentration(1/cm3) | ≦1×10E16 |
Carbon Concentration(1/cm3) | ≦1×10E15 |
Doping Element Concentration(1/cm3) | ≦1×10E17 |
Coefficient of thermal expansion | 2.5(T=300k) |
Linear Expansion Coefficient | (2-9)×10-6 k-1 |
Hardness, Mohs | 7.0 |
Density | 2.33g/cm3 |
Melting point | 1414℃ |
Dielectric Constant | 13 |
Optical Properties |
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Transmission Range |
1.2~8µm |
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Reflection Loss, for two surfaces at 5µm |
46.20% |
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Reflection Index |
See below |
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Wavelength (µm) |
Refractive Index (n) |
Wavelength (µm) |
Refractive Index(n) |
1.357 |
/ |
5.5 |
3.4213 |
1.3951 |
3.4975 |
6 |
3.4202 |
1.6606 |
3.4929 |
6.5 |
3.4195 |
1.8131 |
3.4608 |
7 |
3.4189 |
2.1526 |
3.4476 |
7.5 |
3.4186 |
2.3254 |
3.443 |
8 |
3.4184 |
3 |
3.432 |
8.5 |
3.4182 |
3.5 |
3.4284 |
10 |
3.4179 |
4 |
3.4257 |
10.5 |
3.4178 |
4.5 |
3.4236 |
11.04 |
3.4176 |
5 |
3.4223 |
|